Eberhart, J.P. Primary Author mixed material bibliography Chichester: John Wiley & Sons 1991 eng

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xxx, 545 hlm.; 25 cm Daftar Isi:1. Waves particle beams and matter 2. Basics on radiation - matter interactions 3. Basic theory of elastic scattering 4. Elastic scattering by individual atoms atomic scattering amplitude 5. Diffraction by a crystal 6. Basic theory of electron diffraction 7. Secondary emission 8. Absorption of radiation in materials 9. Sources of X-rays electrons thermal neutron and ions 10. Radiation detectors and spectrometers 11. X-ray and neutron diffraction applied to crystalline materials 12. Electron diffraction on thin crystalline layers 13. Important parameters in spectrometry 14. Elemental analysis by X-ray fluorescence 15. Electron probe microanalysis 16. Electron spectrometry for surface analysis 17. X-ray absorption spectrometry and electron energy loss spectrometry 18. Secondary ion mass spectrometry for surface analysis 19. Transmission electron microscopy 20. Scanning electron microscopy 21. Scanning transmission electron microscopy analytical electron microscopy 22. Scanning tunelling microscopy Appendix A Physical quantities units universal constants notations Appendix B Reciprocal space reciprocal lattice Appendix C Basic properties of fourier transforms Appendix D Spectrometric tables Appendix E AQbbreviations and acronyms Appendix F Radioprotection 1. MATERI - ANALISIS KIMIA 2. MATERI - ANALISIS STRUKTUR 620.112 EBE s 0471929778 UPT Perpustakaan UM Koleksi Bahan Pustaka Perpustakaan UM 1 https%253A%252F%252Fsipadu.um.ac.id%252Fadmin%252Fpengolahan_buku%252Fimages%252Fupdbuku%252F62412.jpg 62412 2019-02-14 00:00:00 2019-02-14 00:00:00 machine generated