Buku

Structural and chemical analysis of materials / J.P. Eberhart



Daftar Isi:1. Waves particle beams and matter 2. Basics on radiation - matter interactions 3. Basic theory of elastic scattering 4. Elastic scattering by individual atoms atomic scattering amplitude 5. Diffraction by a crystal 6. Basic theory of electron diffraction 7. Secondary emission 8. Absorption of radiation in materials 9. Sources of X-rays electrons thermal neutron and ions 10. Radiation detectors and spectrometers 11. X-ray and neutron diffraction applied to crystalline materials 12. Electron diffraction on thin crystalline layers 13. Important parameters in spectrometry 14. Elemental analysis by X-ray fluorescence 15. Electron probe microanalysis 16. Electron spectrometry for surface analysis 17. X-ray absorption spectrometry and electron energy loss spectrometry 18. Secondary ion mass spectrometry for surface analysis 19. Transmission electron microscopy 20. Scanning electron microscopy 21. Scanning transmission electron microscopy analytical electron microscopy 22. Scanning tunelling microscopy Appendix A Physical quantities units universal constants notations Appendix B Reciprocal space reciprocal lattice Appendix C Basic properties of fourier transforms Appendix D Spectrometric tables Appendix E AQbbreviations and acronyms Appendix F Radioprotection



Informasi Detail

Judul Seri
-
Kode Buku
620.112 EBE s
No Reg
00645/PB/95
Penerbit Chichester: John Wiley & Sons : .,
Deskripsi Fisik
xxx, 545 hlm.; 25 cm
Bahasa
ISBN/ISSN
0-471-92977-8
Edisi
-
Subjek
Pernyataan Tanggungjawab

Versi lain/terkait

Tidak tersedia versi lain




Informasi


DETAIL CANTUMAN


Kembali ke sebelumnyaDetail XMLKutip ini